Surface-electrode ion trap development

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Аннотация

 

 

Авторлар туралы

T. Abbasov

Skolkovo Institute of Science and Technology

Email: letters@kapitza.ras.ru

S. Zibrov

P. N. Lebedev Physical Institute Russian Academy of Sciences

Email: letters@kapitza.ras.ru

I. Sherstov

Skolkovo Institute of Science and Technology

Хат алмасуға жауапты Автор.
Email: letters@kapitza.ras.ru

Әдебиет тізімі

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  7. C. W. Chou, D. B. Hume, J. C. J. Koelemeij, D. J. Wineland, and T. Rosenband, Phys. Rev. Lett. 104, 070802 (2010).
  8. S. Seidelin, J. Chiaverini, R. Reichle et al. (Collaboration), Phys. Rev. Lett. 96, 253003 (2006).
  9. K. Khabarova, D. Kryuchkov, A. Borisenko, I. Zalivako, I. Semerikov, M. Aksenov, I. Sherstov, T. Abbasov, A. Tausenev, and N. Kolachevsky, Symmetry 10, 2213 (2022).
  10. R. Fritz, Frequency Standards: Basics and Applications, John Wiley & Sons, Weinheim (2006).
  11. C. E. Pearson, Theory and Application of Planar Ion Traps, Master thesis, University of Washington, Seattle (2006).
  12. J. Chiaverini, R. B. Blakestad, J. Britton, J. D. Jost, C. Langer, D. Leibfried, R. Ozeri, and D. J. Wineland, Quantum Information and Computation 5(6), 419 (2005).
  13. M. Niedermayr, Cryogenic surface ion traps, PhD thesis, University of Innsbruck, Innsbruck (2015).

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