Application of tracing tools for analysis of microcontroller failures arising under the 14 MeV neutrons exposure
- Authors: Pilipenko A.S.1, Tikhonov M.I.1
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Affiliations:
- Fеdеrаl State Unitary Enterprise “Russian Federal Nuclear Center – Zababakhin All-Russia Research Institute of Technical Physics”
- Issue: Vol 69, No 2 (2024)
- Pages: 199-204
- Section: ФИЗИЧЕСКИЕ ПРОЦЕССЫ В ЭЛЕКТРОННЫХ ПРИБОРАХ
- URL: https://rjsvd.com/0033-8494/article/view/650715
- DOI: https://doi.org/10.31857/S0033849424020117
- EDN: https://elibrary.ru/KMELDA
- ID: 650715
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