Effect of crystallographic orientation on the phase transition of a finite TiNi shape memory alloy wafer.
- Authors: Pavlov A.I.1, Kartsev A.I.2,3, Koledov V.V.4, Lega P.V.2,4
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Affiliations:
- Bauman Moscow State Technical University
- RUDN University
- Computational Center of Far East branch Russian Academy of Sciences
- Kotelnikov Institute of Radioengineering and Electronics, Russian Academy of Sciences
- Issue: Vol 68, No 10 (2023)
- Pages: 1035-1039
- Section: ФИЗИЧЕСКИЕ ПРОЦЕССЫ В ЭЛЕКТРОННЫХ ПРИБОРАХ
- URL: https://rjsvd.com/0033-8494/article/view/650456
- DOI: https://doi.org/10.31857/S0033849423100133
- EDN: https://elibrary.ru/DOCWBT
- ID: 650456
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