Investigation of inhomogeneous deformations of crystal lattices during deforming cutting of 08X18N10T steel samples with periodic surface relief

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A technique has been developed for obtaining true X-ray diffraction intensity distribution profiles by X-ray diffractometry to detect inhomogeneous surface deformations of a curved surface with periodic relief by separating the effects associated with the influence of this surface on the shape of the diffraction profile. True intensity distribution profiles related only to inhomogeneous surface deformations and crystal block sizes have been obtained, and the parameters and features of the distribution functions of these deformations have been determined. The proposed approach makes it possible to isolate, among other things, the contribution only from a curved surface with a regular relief of the sample to the shape of the intensity distribution profile.

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B. Vintaikin

Bauman Moscow State Technical University

编辑信件的主要联系方式.
Email: vintaikb@bmstu.ru
俄罗斯联邦, Moscow

Ya. Cherenkov

Bauman Moscow State Technical University

Email: vintaikb@bmstu.ru
俄罗斯联邦, Moscow

A. Smirnov

Bauman Moscow State Technical University

Email: vintaikb@bmstu.ru
俄罗斯联邦, Moscow

S. Vasiliev

Bauman Moscow State Technical University

Email: vintaikb@bmstu.ru
俄罗斯联邦, Moscow

参考

  1. Аэро Э.Л. // Вестн. Пермского технич. ун-та. Механика. 2006. № 14. С. 27.
  2. Кривоглаз А.М. Дифракция рентгеновских лучей и нейтронов в неидеальных кристаллах. Киев: Наукова думка, 1983. 407 с.
  3. Винтайкин Б.Е., Кузьмин Р.Н. // Кристаллография. 1986. Т. 31. Вып. 4. С. 656.
  4. Зубков Н.Н., Овчинников А.И. Способ получения поверхностей с чередующимися выступами и впадинами (варианты) и инструмент для его осуществления: пат. 2044606 РФ // Бюлл. № 27. 1995.
  5. Неустроев В.С., Маркелов Д.Е., Обухов А.В. и др. // Вопросы материаловедения. 2021. Т. 4. № 4 (108). С. 233.
  6. Зубков Н.Н. // Ремонт, восстановление, модернизация. 2003. Т. 10. С. 7.
  7. Зубков Н.Н., Овчинников А.И., Васильев С.Г. Способ упрочнения поверхности детали: пат. RU 2 015 202 C1. 1994.
  8. Черенков Я.В., Винтайкин Б.Е., Смирнов А.Е. // Кристаллография. 2022. Т. 67. № 4. С. 645.
  9. Vintaikin B.E., Kamynin A.V., Kraposhin V.S. et al. // J. Phys: Conf. Ser. 2017. № 918. P. 012014. https://doi.org/10.108/1742-6596/918/1/012014
  10. Гинье А. Рентгенография кристаллов. М.: Физ.-мат. литература, 1961. 604 с.
  11. Langford J.L., Prince E., Stalick J. // Mater. Sci. Eng. Lab. 1992. V. 2. P. 110.
  12. Halder N.C., Wagner C.N.J. // Acta Cryst. 1966. № 20. P. 312.
  13. Williamson G.K., Hall W. // Acta Metallurgica. 1953. № 1. P. 22.
  14. Александрова Н.М., Черетаева А.О., Мишетьян А.Р. и др. // МИТОМ. 2020. № 11. С. 13.

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2. Fig. 1. Scheme of deforming cutting (a) and microstructure of the cross-section of ribbing on 08Kh18N10T steel after deforming cutting in DR-1 (b) and DR-2 (c) modes: 1 – main cutting edge, 2 – auxiliary (deforming) edge, 3 – front surface, Dr – main cutting movement, Ds – feed movement, the area examined by the X-ray method is marked with a circle.

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3. Fig. 2. Distribution of intensity in the 220 reflection profile for samples after: 1 – ribbing, 2 – ribbing and annealing, 3 – annealing without ribbing; 4 – result of solving the Fredholm equation, corresponding to the blurring of diffraction maxima, only due to inhomogeneous deformations and grain size.

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4. Fig. 3. Distribution of intensity in the reflection profile 311 and 222 for samples: 1 – after ribbing by the DR-1 method, 2 – annealing with a treated surface by the DR-1 method, 4 – a sample with a flat surface; 3 – the result of solving the Fredholm equation, corresponding to the blurring of diffraction maxima only due to inhomogeneous deformations of the DR-1.

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5. Fig. 4. Comparison of the reflection profiles (311) and (222) of annealed samples with different interfin gaps after DR-1 and DR-2 of samples (3 and 4); true reflection profiles (1 and 2) for samples not annealed after DR, corresponding to graphs 3 and 4. Graphs 1 and 2 are given with an increased intensity scale.

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6. Fig. 5. Intensity distribution characterizing only the contribution from the curved surface for the profiles shown in Fig. 4 (3 and 4): 1 – profile of sample DR-1, 2 – profile of sample DR-2.

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