The Radiation Resistance of Microelectronic Devices under the Combined Influence of Destabilizing Factors of Space at the Design Stage
- Authors: Didyk P.I.1, Zhukov A.A.2
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Affiliations:
- Moscow Aviation Institute (National Research University), 125993, Moscow, Russia
- Moscow Aviation Institute, (National Research University)
- Issue: Vol 61, No 3 (2023)
- Pages: 242-247
- Section: Articles
- URL: https://rjsvd.com/0023-4206/article/view/672659
- DOI: https://doi.org/10.31857/S0023420622600209
- EDN: https://elibrary.ru/BVDRNL
- ID: 672659
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