Informaçao sobre o Autor
Сороковиков, М. Н.
| Edição | Seção | Título | Arquivo |
| Nº 9 (2023) | Articles | Determining the Collimation Degree for a Coherent X-Ray Beam Using a Planar Multilens Interferometer |
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Palavras-chave
X-ray diffraction
X-ray diffraction analysis
X-ray photoelectron spectroscopy
compact neutron source
density functional theory
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
neutron reflectometry
phase composition
scanning electron microscopy
scanning probe microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Edição corrente
Nº 1 (2025)
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Usuário
Assinatura
Entrar no sistema para verificar sua assinatura
Palavras-chave
X-ray diffraction
X-ray diffraction analysis
X-ray photoelectron spectroscopy
compact neutron source
density functional theory
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
neutron reflectometry
phase composition
scanning electron microscopy
scanning probe microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Edição corrente
Nº 1 (2025)
Informações